Quantification of surface hydroxides using chemical labeling and XPS
Authors:
- 1 February 1992
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 18 (2) , 141-146
Abstract
XPS when used in conjunction with silylation can determine surface hydroxide. The penetration depth was studied using DRIFT and various silylation conditions. Application of this technique to many different inorganic matrices, including Si 3 N 4 , glass, silica thin film, zinc silicate lamp phosphor and Al 2 O 3 , is illustrated.Keywords
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