Abstract
This study reports the effect of interfacial structure on the magnetoelectric and ferroelectric characteristics in magnetoelectric laminate thin/thick films. Both bilayer and trilayer magnetoelectric heterostructures were deposited on a Pt/Ti/SiO2/Si substrate using pulsed laser deposition (PLD) and sol-gel deposition (SGD) respectively. BaTiO3 [BTO] / Pb(Zr0.6Ti0.4)O3 [PZT] and CoFe2O4 [CFO] were used as piezoelectric and magnetostrictive materials. The interface between CFO/PZT and CFO/BTO films was found to exhibit excellent interface without any cracks or delamination. PLD grown BTO on CFO was found to exhibit the columnar structure. SG deposited PZT/CFO/PZT tri-layer structure exhibited granular structure with high density. Ferroelectric and magnetoelectric coefficient of as-grown films was investigated to understand the effect of interface characteristics. Good ME coupling for the trilayer structure provided important insight about the nature of elastic strain coupling.