A Fault-Tolerance Nanoscale Design for Binary-to-Gray Converter based on QCA

Authors:
Publisher website
Google Scholar
Abstract
The very-large-scale-integration industry has been highly trying to attain miniaturization. This function causes several challenges regarding size, switching speed, power, and fault-tolerant at the nanoscale. Quantum-dot cellular automata (QCA) can contain a remarkable reduction in scale, fast switching rate, ultra-low energy consumption, and high fault-tolerant. Thus, fault-tolerant logic has attained the attention of several investigators in the QCA science domain. On the other hand, a binary-to-gray converter converts the input data to the gray number to facilitate error correction in digital communication. So, in the present investigation, we have demonstrated a structure of fault-tolerant binary-to-gray converter in QCA employing the majority gate, inverter gate, and cell redundancy on the wire. With the utilization of the QCADesigner 2.0.3 simulator, we have simulated and tested proposed circuits. In this paper, four factors, namely single-cell missing, displacement, misalignment, and extra single-cell, have been inspected by simulation software. The proposed fault-tolerant two-bit, three-bit, and four-bit binary-to-gray converter could attain 100% fault tolerance while a single missing defect existed in the layout.

This publication has 31 references indexed in Scilit: