Smart TDI readout circuit for long-wavelength IR detector

Authors:

1 August 2002

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 38 (16) , 854-855
DOI:10.1049/el:20020621

Abstract

A smart time delay and integration (TDI) readout circuit is suggested which performs background suppression, cell-to-cell non-uniformity compensation, and dead pixel correction. Using the smart TDI readout circuit, the integration capacitor area occupying almost the whole area of a unit-cell can be reduced to one-fifth and transimpedance gain can increase by five times. From measurement results, it is found that the skimming current error for a few hundred nA background current is <1.25 nA corresponding to LSB/2 of ADC and the non-uniformity introduced by cell-to-cell background current variation is reduced to 1.02 nA.

Keywords

LONG-WAVELENGTH IR DETECTOR
INTEGRATION CAPACITOR AREA
SIGNAL PROCESSING CIRCUIT
LIMITED SMALL PIXEL AREA
BACKGROUND SUPPRESSION
ADC OUTPUTS
SMART TDI READOUT CIRCUIT
JUNCTION LEAKAGE CURRENT
SKIMMING CURRENT ERROR
CELL-TO-CELL NONUNIFORMITY COMPENSATION
TRANSIMPEDANCE GAIN
BUFFERED DIRECT INJECTION INPUT CIRCUIT
DEAD PIXEL CORRECTION

This publication has 1 reference indexed in Scilit:

Current copier cells
Electronics Letters, 1988