Structural Basis for the Conducting Interface betweenand
Top Cited Papers
- 9 October 2007
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 99 (15) , 155502
Abstract
The complete atomic structure of a five-monolayer film of on has been determined for the first time by surface x-ray diffraction in conjunction with the coherent Bragg rod analysis phase-retrieval method and further structural refinement. Cationic mixing at the interface results in dilatory distortions and the formation of metallic . By invoking electrostatic potential minimization, the ratio of across the interface was determined, from which the lattice dilation could be quantitatively explained using ionic radii considerations. The correctness of this model is supported by density functional theory calculations. Thus, the formation of a quasi-two-dimensional electron gas in this system is explained, based on structural considerations.
Keywords
This publication has 24 references indexed in Scilit:
- Effect of oxygen vacancies in thesubstrate on the electrical properties of theinterfacePhysical Review B, 2007
- Charge compensation and mixed valency inheterointerfaces studied by the FLAPW methodPhysical Review B, 2006
- Tunable Quasi-Two-Dimensional Electron Gases in Oxide HeterostructuresScience, 2006
- SrTiO3(001)∣LaAlO3(001) multilayers: A density-functional investigationActa Materialia, 2006
- Photoemission from Buried Interfaces inSuperlatticesPhysical Review Letters, 2006
- Charge localization or itineracy atinterfaces: Hole polarons, oxygen vacancies, and mobile electronsPhysical Review B, 2006
- Lattice-polarization effects on electron-gas charge densities in ionic superlatticesPhysical Review B, 2006
- Why some interfaces cannot be sharpNature Materials, 2006
- A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerfaceNature, 2004
- Electric field effect in correlated oxide systemsNature, 2003