Secondary ion and laser ablation mass spectrometry for the quantitative characterization of styrene–butadiene copolymers
Authors:
- 13 December 2002
- journal article
- Published by Wiley in Journal of Mass Spectrometry
- Vol. 38 (1) , 50-57
Abstract
Styrene–butadiene copolymers were analyzed by static secondary ion mass spectrometry (S‐SIMS) and laser ablation Fourier transform ion cyclotron resonance mass spectrometry (LA‐FTICRMS) to obtain quantitative information based on specific ions. Silver deposition was performed on polystyrene, butadiene rubber and styrene–butadiene rubber. Under these experimental conditions, new secondary ions were detected, in particular silver‐cationized butadiene [Mbutadiene − Ag]+ and styrene [Mstyrene − Ag]+ monomers. In contrast, LA‐FTICRMS experiments did not require pretreatment. At high laser power density, UV photons (193, 266 and 355 nm) allowed the detection of styrene and butadiene monomers at m/z 104 and 54, respectively. The use of the observed ions by SIMS or LA‐FTICRMS ensures that quantitative information on the relative distribution of each monomer is obtained. However, the silver coating thickness in the SIMS experiment seems to have an important influence on the quantitative information obtained. For LA‐FTICRMS experiments, the best results are obtained at a wavelength of 355 nm. Copyright © 2003 John Wiley & Sons, Ltd.Keywords
This publication has 15 references indexed in Scilit:
- Quantitative surface characterization of poly(styrene)/poly(4‐vinyl phenol) random and block copolymers by ToF‐SIMS and XPSSurface and Interface Analysis, 2001
- Speciation analysis of oxides with static secondary ion mass spectrometryRapid Communications in Mass Spectrometry, 1999
- Molecular Weight Effects on Polystyrene Fingerprint Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) SpectraMacromolecules, 1997
- Quantitative Surface Analysis of Ethylene-Propylene Polymers using ToF-SIMSSurface and Interface Analysis, 1997
- Quantitative surface analysis of styrene–butadiene copolymers using time‐of‐flight secondary ion mass spectrometrySurface and Interface Analysis, 1995
- Time‐of‐flight secondary ion mass spectrometry of polybutadienesSurface and Interface Analysis, 1994
- Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometryAnalytical Chemistry, 1991
- Laser microprobe fourier transform mass spectrometry. Preliminary results for feasibility and evaluationRapid Communications in Mass Spectrometry, 1988
- Design and performance of a reflectron based time-of-flight secondary ion mass spectrometer with electrodynamic primary ion mass separationJournal of Vacuum Science & Technology A, 1987
- Time-of-flight secondary ion mass spectrometry of polymers in the mass range 500-10000Macromolecules, 1987