Degradation of HTL layers during device operation in PhOLEDs
Authors:
- Varatharajan SivasubramaniamVSVaratharajan Sivasubramaniam
- Florian BrodkorbFBFlorian Brodkorb
- Stephanie HanningSHStephanie Hanning
- Oliver ButtlerOBOliver Buttler
- Hans Peter LoeblHLHans Peter Loebl
- Volker van ElsbergenVEVolker van Elsbergen
- Herbert BoernerHBHerbert Boerner
- Ullrich ScherfUSUllrich Scherf
- Martin KreyenschmidtMKMartin Kreyenschmidt
- 1 November 2009
- journal article
- Published by Elsevier in Solid State Sciences
- Vol. 11 (11) , 1933-1940
Abstract
No abstract availableKeywords
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