Nonalloyed Ohmic contacts to n-GaAs by molecular beam epitaxy

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Abstract
We report the formation of Ohmic contacts to n‐GaAs without the need for a high‐temperature alloy. Heavily doped n‐GaAs(Sn) was grown using molecular beam epitaxy in which the concentration of free carriers was as high as ‖ND−NA‖=6×1019 cm−3 yielding specific contact resistance rc=1.86×10−6 Ω‐cm2.

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