A Combined Total Reflection-Transmission Method in Application to Dielectric Spectroscopy
Authors:
- Stanislaw S. StuchlySSStanislaw S. Stuchly
- Miroslaw MatuszewskiMMMiroslaw Matuszewski
- 1 January 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 27 (3) , 285-288
Abstract
A combined total reflection-transmission method for permittivity measurements at radio and microwave frequencies is described. Analytical expressions for the dielectric constant and the loss factor of a sample, viewed as a two-port in the transmission system, in terms of the measured scattering parameters are given. ne uncertainty of measurements of the dielectric constant and the loss factor is discussed and a method ofselecting an optimum sample length is suggested.Keywords
This publication has 3 references indexed in Scilit:
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- Measurement of RF properties of materials a surveyProceedings of the IEEE, 1967