Accurate transmission line characterization
Authors:
- 1 August 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Microwave and Guided Wave Letters
- Vol. 3 (8) , 247-249
Abstract
A method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics is introduced. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.Keywords
This publication has 9 references indexed in Scilit:
- Calibrating On-Wafer Probes to the Probe Tips1992
- Planar Resistors for Probe Station Calibration1992
- Interconnection Transmission Line Parameter Characterization1992
- A general waveguide circuit theoryJournal of Research of the National Institute of Standards and Technology, 1992
- S-parameter-based IC interconnect transmission line characterizationIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1992
- Comparison of On-Wafer Calibrations1991
- Transmission line capacitance measurementIEEE Microwave and Guided Wave Letters, 1991
- A multiline method of network analyzer calibrationIEEE Transactions on Microwave Theory and Techniques, 1991
- Characteristic impedance determination using propagation constant measurementIEEE Microwave and Guided Wave Letters, 1991