System efficient ESD design
Authors:
- 1 December 2015
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 55 (12) , 2607-2613
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- System ESD robustness by co-design of on-chip and on-board protection measuresMicroelectronics Reliability, 2010