Microoptic double beam system for reflectance and absorption measurements at high pressure
Authors:
- 1 May 1982
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 53 (5) , 644-650
Abstract
A microoptical double beam system for reflectance and absorption measurements from small samples (less than 100 μm size) in the spectral range of 0.5–5 eV is described. In conjunction with a diamond anvil high‐pressure cell the system is particularly useful for optical reflectivity measurements at pressures up to 400 kbar. Examples are furnished illustrating the use of the system in high‐pressure investigations of the stage two graphite intercalation compound C24SbCl5 and of solid oxygen. We briefly comment on Raman spectroscopy at high pressure.Keywords
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