Advanced on-wafer multiport calibration methods for mono- and mixed-mode device characterization

This publication has 17 references indexed in Scilit:

• On-wafer calibration using space-conservative (SOLT) standards
  2003
• New theoretical analysis of the LRRM calibration technique for vector network analyzers
  IEEE Transactions on Instrumentation and Measurement, 2001
• Lumped-Element Models for On-Wafer Calibration
  2000
• Load Models for CPW and Microstrip SOLT Standards on GaAs
  2000
• Robust SOLT and alternative calibrations for four-sampler vector network analyzers
  IEEE Transactions on Microwave Theory and Techniques, 1999
• Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
  IEEE Transactions on Instrumentation and Measurement, 1997
• QSOLT: A New Fast Calibration Algorithm for Two Port S Parameter Measurements
  1991
• Characterization of Thin-Film Calibration Elements
  1991
• Thru-Match-Reflect: One Result of a Rigorous Theory for De-Embedding and Network Analyzer Calibration
  1988
• An Explicit Solution for the Scattering Parameters of a Linear Two-Port Measured with an Imperfect Test Set (Correspondence)
  IEEE Transactions on Microwave Theory and Techniques, 1971