AutoTEM 5 – Fully Automated TEM Sample Preparation for Materials Science

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Publisher website

1 June 2019

journal article
vendor symposium
Published by Oxford University Press (OUP) in Microscopy and Microanalysis

Vol. 25 (S2) , 554-555
DOI:10.1017/s1431927619003507

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

Introduction to Focused Ion Beams
2005