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Publications
Angle‐resolved Scanning Transmission Electron Microscopy ( ARSTEM ) for materials analysis
Home
Publications
Angle‐resolved Scanning Transmission Electron Microscopy ( ARSTEM ) for materials analysis
Angle‐resolved Scanning Transmission Electron Microscopy ( ARSTEM ) for materials analysis
Authors:
KM
Knut Müller‐Caspary
Knut Müller‐Caspary
OO
Oliver Oppermann
Oliver Oppermann
TG
Tim Grieb
Tim Grieb
AR
Andreas Rosenauer
Andreas Rosenauer
MS
Marco Schowalter
Marco Schowalter
FK
Florian F. Krause
Florian F. Krause
TM
Thorsten Mehrtens
Thorsten Mehrtens
PP
Pavel Potapov
Pavel Potapov
AB
Andreas Beyer
Andreas Beyer
KV
Kerstin Volz
Kerstin Volz
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Open Access
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20 December 2016
book chapter
Published by
Wiley
p.
649-650
DOI:
10.1002/9783527808465.emc2016.5605
Abstract
No abstract available
Keywords
STEM
COMPOSITION ANALYSIS
SEMICONDUCTORS
MOSFET
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