Electrostatic Energy Analyzer for Studying Gas-Focused Electron Beams and Their Background Media
Authors:
- 1 November 1968
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 39 (11) , 1714-1720
Abstract
An analyzer is described which is especially suitable for the study of electrostatically self-focusing electron beams and their associated background media, and, in general, for media which by their nature are very sensitive to direct insertion of probes or other diagnostic devices. The basic difficulties with devices of this nature, namely, (a) the continually changing work functions of metal surfaces due to sorbed films and (b) the lens effect defocusing due to nonuniformities of the potential in the neighborhood of grid wires, have been identified and effectively overcome. The analyzer is employed flush with the boundary of the medium under study and it incorporates a shielding electrode so that the disturbance of the medium is insignificant. When the dimensions of the instrument are scaled so that the space charge effects are absent, it can be utilized successfully to detect energy spreads as small as a few tenths of an electron volt.Keywords
This publication has 13 references indexed in Scilit:
- Time-of-Flight Electron Velocity SpectrometerReview of Scientific Instruments, 1967
- Electron beam spectroscopyReports on Progress in Physics, 1965
- Temperature and density in the ionized upper atmosphere at 4000 to 5300 kilometersJournal of Geophysical Research, 1965
- Photocontrol of Growth Rate of Thin Polymer Films Formed by Electron BombardmentJournal of Applied Physics, 1963
- AN IMPROVED ELECTROSTATIC ELECTRON SELECTORCanadian Journal of Physics, 1960
- Pulse Technique for Probe Measurements in Gas DischargesJournal of Applied Physics, 1959
- Space Charge Limited Currents1954
- Electrode Contamination in Electron Optical SystemsProceedings of the Physical Society. Section B, 1953
- Reliability of Probe Measurements in Hot Cathode Gas DiodesJournal of Applied Physics, 1952
- Probe Technique for the Measurement of Electron TemperatureJournal of Applied Physics, 1951