Strong anomalous optical dispersion of graphene: complex refractive index measured by Picometrology
Authors:
- 19 December 2008
- journal article
- Published by Optica Publishing Group in Optics Express
- Vol. 16 (26) , 22105-22112
Abstract
We introduce spinning-disc Picometrology which is designed to measure complex refractive index of ultra-thin and size-limited sample deposited on a solid surface. Picometrology is applied to measure the refractive index of graphene on thermal oxide on silicon. The refractive index varies from ñg=2.4-1.0i at 532 nm to ñg=3.0-1.4i at 633 nm at room temperature. The dispersion is five times stronger than bulk graphite (2.67- 1.34i to 2.73-1.42i from 532 nm to 633 nm).Keywords
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