X-ray diffraction studies of thin films and multilayer structures
Authors:
- Armin SegmüllerASArmin Segmüller
- I.C. NoyanINI.C. Noyan
- V.S. SperiosuVSV.S. Speriosu
- 1 January 1989
- journal article
- Published by Elsevier in Progress in Crystal Growth and Characterization
- Vol. 18, 21-66
Abstract
No abstract availableKeywords
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