Future directions in high-resolution electron microscopy: Novel optical components and techniques
Author:
- Peter HawkesPHPeter Hawkes
- 24 January 2014
- journal article
- Published by MathDoc/Centre Mersenne in Comptes Rendus. Physique
- Vol. 15 (2-3) , 110-118
Abstract
No abstract availableKeywords
This publication has 74 references indexed in Scilit:
- Progress toward an aberration-corrected low energy electron microscope for DNA sequencing and surface analysisJournal of Vacuum Science & Technology B, 2012
- Tuning Fifth-Order Aberrations in a Quadrupole-Octupole CorrectorMicroscopy and Microanalysis, 2012
- Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imagingNature Communications, 2012
- Design of a hybrid double-sideband/single-sideband (schlieren) objective aperture suitable for electron microscopyUltramicroscopy, 2011
- Adaptive aberration correction using a triode hyperbolic electron mirrorUltramicroscopy, 2011
- Theory of free electron vorticesUltramicroscopy, 2011
- Object-wave reconstruction by carbon film-based Zernike- and Hilbert-phase plate microscopy: A theoretical study not restricted to weak-phase objectsUltramicroscopy, 2011
- Design of an electron microscope phase plate using a focused continuous-wave laserNew Journal of Physics, 2010
- Practical factors affecting the performance of a thin-film phase plate for transmission electron microscopyUltramicroscopy, 2009
- ber einige Fehler von ElektronenlinsenThe European Physical Journal A, 1936