Interpretation of experimentally observed C-t responses for copper contaminated devices
Authors:
- Lichyn LeeLLLichyn Lee
- Harold G ParksHPHarold G Parks
- Ronald D SchrimpfRSRonald D Schrimpf
- 31 March 1996
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 39 (3) , 369-375
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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