5.7 A 29nW bandgap reference circuit

Authors:
Publisher website
Google Scholar
Abstract
Bandgap references (BGRs) are widely used to generate a temperature-insensitive reference voltage determined by the silicon bandgap. the BGR generally utilizes PN diodes to generate both of proportional-to-absolute-temperature (PTAT) and complementary-to-absolute-temperature (CTAT) quantities and combines them to eliminate the temperature dependency. Though the BGR provides a robust voltage or current reference with insensitivity to process, voltage and temperature variations that is superior to CMOS-only reference circuits, it has received little attention in ultra-low-power (ULP) sensor applications. While CMOS-only reference circuits have recently demonstrated nanowatt power consumption, BGR approaches still have two critical factors to preventing nanowatt consumption. One is that PTAT generation assumes sufficient forward bias, VD, of the PN junction to allow e VD/(n·VT) to be much larger than 1 in the temperature range of interest, where n and VT (=kT/q) represent the ideality factor and the thermal voltage, respectively. In addition, the PTAT generation requires a start-up circuit to prevent the circuit from resting at the undesirable zero-bias condition. Since the start-up circuit utilizes a resistive voltage division between power rails, it consumes non-zero DC current, which must be larger than leakage current in order to ensure stable start-up operation. These two requirements for PTAT generation limit the use of BGRs in nanowatt ULP applications.

This publication has 7 references indexed in Scilit: