Interpretation of AES depth profiles of porous Al anodic oxides
Authors:
- T.S. SunTST.S. Sun
- D.K. McNamaraDMD.K. McNamara
- J.S. AhearnJAJ.S. Ahearn
- J.M. ChenJCJ.M. Chen
- B. DitchekBDB. Ditchek
- J.D. VenablesJVJ.D. Venables
- 1 August 1980
- journal article
- Published by Elsevier in Applications of Surface Science
- Vol. 5 (4) , 406-425
Abstract
No abstract availableKeywords
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