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Measurement of the adhesion and removal forces of submicrometer particles on silicon substrates
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Measurement of the adhesion and removal forces of submicrometer particles on silicon substrates
Measurement of the adhesion and removal forces of submicrometer particles on silicon substrates
Authors:
AB
Ahmed Busnaina
Ahmed Busnaina
JT
Jack Taylor
Jack Taylor
IK
Ismail Kashkoush
Ismail Kashkoush
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1 January 1993
journal article
Published by
Taylor & Francis
in
Journal of Adhesion Science and Technology
Vol. 7
(5)
,
441-455
DOI:
10.1163/156856193x00321
Abstract
In this study, the magnitude of the applied removal force and its relationship to the theoretical adhesion force is determined. The removal is done through the application of known hydrodynamic dra...
Keywords
ADHESION FORCE
CONTAMINATION
DEFORMATION
DEPOSITION
PARTICLES
REMOVAL FORCE
SAFFMAN LIFT
SHEAR STRESS
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