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4H-SiC MOSFETs on C(000-,1) Face with Inversion Channel Mobility of 127cm2/Vs
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4H-SiC MOSFETs on C(000-,1) Face with Inversion Channel Mobility of 127cm2/Vs
4H-SiC MOSFETs on C(000-,1) Face with Inversion Channel Mobility of 127cm2/Vs
Authors:
KF
Kenji Fukuda
Kenji Fukuda
MK
Makoto Kato
Makoto Kato
JS
Junji Senzaki
Junji Senzaki
KK
Kazutoshi Kojima
Kazutoshi Kojima
TS
Takaya Suzuki
Takaya Suzuki
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15 June 2004
journal article
Published by
Trans Tech Publications, Ltd.
in
Materials Science Forum
Vol. 457-460
,
1417-1420
DOI:
10.4028/www.scientific.net/msf.457-460.1417
Abstract
No abstract available
Keywords
CARBON FACE
INTERFACE STATES (OR TRAPS)
INVERSION CHANNEL MOBILITY
METAL-OXIDE-SEMICONDUCTOR FIELD EFFECT TRANSISTOR (MOSFET)
SILICON CARBIDE (SIC)
Cited
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