Decoupled Knowledge Distillation
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- 1 June 2022
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 11943-11952
Abstract
State-of-the-art distillation methods are mainly based on distilling deep features from intermediate layers, while the significance of logit distillation is greatly overlooked. To provide a novel viewpoint to study logit distillation, we re-formulate the classical KD loss into two parts, i.e., target class knowledge distillation (TCKD) and non-target class knowledge distillation (NCKD). We empirically investigate and prove the effects of the two parts: TCKD transfers knowledge concerning the “difficulty” of training samples, while NCKD is the prominent reason why logit distillation works. More importantly, we reveal that the classical KD loss is a coupled formulation, which (1) suppresses the effectiveness of NCKD and (2) limits the flexibility to balance these two parts. To address these issues, we present Decoupled Knowledge Distillation (DKD), enabling TCKD and NCKD to play their roles more efficiently and flexibly. Compared with complex feature-based methods, our DKD achieves comparable or even better results and has better training efficiency on CIFAR-100, ImageNet, and MS-COCO datasets for image classification and object detection tasks. This paper proves the great potential of logit distillation, and we hope it will be helpful for future research. The code is available at https://github.com/megviiresearch/mdistiller.Keywords
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This publication has 24 references indexed in Scilit:
- Squeeze-and-Excitation Networks2018
- Deep Mutual Learning2018
- Mask R-CNN2017
- A Gift from Knowledge Distillation: Fast Optimization, Network Minimization and Transfer Learning2017
- Feature Pyramid Networks for Object Detection2017
- Mimicking Very Efficient Network for Object Detection2017
- Pyramid Scene Parsing Network2017
- Faster R-CNN: Towards Real-Time Object Detection with Region Proposal NetworksIEEE Transactions on Pattern Analysis and Machine Intelligence, 2016
- Deep Residual Learning for Image Recognition2016
- ImageNet Large Scale Visual Recognition ChallengeInternational Journal of Computer Vision, 2015