Edgeless detectors fabricated by dry etching process
- 1 July 2006
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 563 (1) , 70-73
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- First test of cold edgeless silicon microstrip detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2004
- Technology development of 3D detectors for high-energy physics and imagingNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2002
- Channeling and diffusion in dry-etch damageJournal of Applied Physics, 1997