Hot-Electron Spectroscopy of GaAs
Authors:
- 8 April 1985
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 54 (14) , 1570-1572
Abstract
We report a new technique that enabled us to measure nonequilibrium carrier transport in GaAs. Hot electrons were injected into -GaAs with an excess energy of 0.25 eV above the conduction-band edge. The effect of scattering on the injected electrons was observed by use of a planar doped barrier as a "hot-electron spectrometer." The measured spectra indicated that significant scattering occurred and that mean free paths were on the order of a few hundred angstroms.
Keywords
This publication has 3 references indexed in Scilit:
- Charge injection over triangular barriers in unipolar semiconductor structuresApplied Physics Letters, 1981
- Planar-doped barriers in GaAs by molecular beam epitaxyElectronics Letters, 1980
- Electron scattering interaction with coupled plasmon-polar-phonon modes in degenerate semiconductorsPhysical Review B, 1978