Practical methods for the measurement of spatial coherence—A comparative study
Authors:
- C. DwyerCDC. Dwyer
- P.C. TiemeijerPTP.C. Tiemeijer
- J. EtheridgeJEJ. Etheridge
- 1 July 2011
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 111 (8) , 1437-1446
Abstract
No abstract availableKeywords
Funding Information
- FEI Company
- nanoTechnology Systems
- The Australian Research Council (LP0990059)
This publication has 27 references indexed in Scilit:
- Elemental mapping at the atomic scale using low accelerating voltagesUltramicroscopy, 2010
- Measurement of effective source distribution and its importance for quantitative interpretation of STEM imagesUltramicroscopy, 2010
- Method to measure spatial coherence of subangstrom electron beamsApplied Physics Letters, 2008
- Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected MicroscopyScience, 2008
- Young’s double-slit interference experiment with electronsAmerican Journal of Physics, 2007
- Element-selective imaging of atomic columns in a crystal using STEM and EELSNature, 2007
- Two-Dimensional Mapping of Chemical Information at Atomic ResolutionPhysical Review Letters, 2007
- Atomic Resolution Elemental Map of EELS with a Cs Corrected STEMMicroscopy and Microanalysis, 2006
- Image formation and contrast from the convergent electron beamPhilosophical Magazine, 1973
- The concept of partial coherence in opticsProceedings of the Royal Society of London. A. Mathematical and Physical Sciences, 1951