Sensitization Development in Austenitic Stainless Steel: Correlation Between STEM-EDS and EPR Measurements

Authors:
  • SBS. M. Bruemmer
    S. M. Bruemmer
  • LCL. A. Charlot
    L. A. Charlot
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Abstract
Direct measurements of grain boundary chromium depletion by energy dispersive x-ray spectroscopy (EDS) in a scanning transmission electron microscope (STEM) are compared to measurements of the degree of sensitization (DOS) using the electrochemical potentiokinetic reactivation (EPR) test technique. Results indicate that the EPR test attacks chromium-depleted regions in austenitic stainless steels (SSs) that contain less than about 12.5 to 73.5 wt% chromium. The amount of attack depends on the width and on the depth of the depleted region. Correlations are presented between STEM-EDS and EPR-DOS measurements and discussed based on the width and volume of chromium-depleted material in both AISI(1) 304 and 316 SSs. Implications of such correlations on the ability to quantitatively model sensitization development are also discussed.

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