Gas-flow electron detector with sample rotation for near surface EXAFS of single crystals
Authors:
- T. TyliszczakTTT. Tyliszczak
- A.P. HitchcockAHA.P. Hitchcock
- 1 June 1989
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 158 (1-3) , 335-336
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structurePhysical Review B, 1988
- Electron yield X-ray absorption spectroscopy at atmospheric pressurePhysics Letters A, 1987