Very Low 1/f Noise and Radiation-Hardened CMOS Preamplifier for High-Sensitivity Search Coil Magnetometers
Authors:
- 2 August 2012
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Sensors Journal
- Vol. 13 (1) , 159-166
Abstract
A 4 nV/√(Hz) at 10 Hz preamplifier with a 12-mW power consumption in complimentary metal-oxide-semiconductor 0.35 μm technology has been developed to go one step further in the integration of the preamplifier of a search coil magnetometer. The present application-specific integrated circuit (ASIC) preamplifier, combined with a 10-cm length, 12-mm diameter, and 15 000 turns search coil sensor demonstrates a noise equivalent magnetic induction as low as 2 pT/√(Hz) at 10 Hz and 14 fT/√(Hz) at 4 kHz. The measured current noise is only 46 fA/√(Hz). AC magnetometers (from 100 mHz to a few kHz) based on search coil sensors are used for space plasma physics investigations because of their excellent robustness and very high sensitivity. The present ASIC preamplifier offers a way to considerably save weight, volume, and power. This paper will focus on the design of the ASIC, driven by the following criteria: low thermal and 1/f noise, radiation hardness for space purpose, and power consumption.Keywords
This publication has 19 references indexed in Scilit:
- Integration of the electronics and batteries inside the hollow core of a search coilJournal of Applied Physics, 2010
- The THEMIS Mission2009
- End of Moore's law: thermal (noise) death of integration in micro and nano electronicsPhysics Letters A, 2002
- Advanced Space Plasma Physics1997
- Flicker noise in CMOS transistors from subthreshold to strong inversion at various temperaturesIEEE Transactions on Electron Devices, 1994
- 1/f noise and radiation effects in MOS devicesIEEE Transactions on Electron Devices, 1994
- A review of magnetic sensorsProceedings of the IEEE, 1990
- Determination of Si-SiO/sub 2/ interface trap density by 1/f noise measurementsIEEE Transactions on Electron Devices, 1988
- High-frequency noise measurements on FET's with small dimensionsIEEE Transactions on Electron Devices, 1986
- Thermal Noise in Field-Effect TransistorsProceedings of the IRE, 1962