Transition Detector-Based Radiation-Hardened Latch for Both Single- and Multiple-Node Upsets
- 3 July 2019
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems II: Express Briefs
- Vol. 67 (6) , 1114-1118
Abstract
This brief presents an output transition detector-based radiation-hardened latch (TDRHL) for reliability improvement. With an error recovery assistant logic and an in-situ transition detector, for any radiation induced single-and double-node upsets, the proposed TDRHL can 1) provide full self-recovery capability, and 2) generate a warning signal for architecture-level recovery when soft errors cause the latch output flipped. The evaluation results show that TDRHL outperforms state-of-the-art DNU tolerant designs with addition error detection capability, and up to 5.0X PDP improvement can be achieved.Keywords
Funding Information
- Waseda University and Toshiba Memory Corporation
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