Raman scattering as a diagnostic technique for cathode characterization
Authors:
- J.R. MitchellJMJ.R. Mitchell
- R.W. GrowRGR.W. Grow
- 1 August 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 34 (8) , 1842-1847