Deposition and characterization of ZnO/NiO thin films
Authors:
- 1 January 2016
- conference paper
- Published by AIP Publishing in AIP Conference Proceedings
- Vol. 1731 (1) , 080033
Abstract
In this work, p-n hetrojunctions based on p-NiO and n-ZnO composite nanostructures were successfully deposited by sol-gel spin coating method. Structural investigations indicate well aligned ZnO nanorods with hexagonal faces having a preferential orientation along the c-axis (002). Scanning electron microscopy (SEM) was used to characterize, the p-n heterostructures formed grain like spherical structure of NiO fully covered the hexagonal rods of ZnO in the NiO/ZnO thin film and elements were confirmed from EDX analysis. PL and micro-Raman spectra of the deposited films showed the variation in luminescence and structural properties due to the formation of heterojuction of NiO.Keywords
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