Fourier analysis of polymer x‐ray diffraction patterns

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Abstract
In analyzing the shapes of diffraction peaks from polymers, it has been mistakenly assumed that it is possible to distinguish between models based on “microstrains” and on paracrystallinity. It is shown that either paracrystallinity or distortions due to dislocations give rise to disorder of the second kind and cannot be distinguished by current diffraction methods. Fourier analysis of shapes of peaks from polymers gives quite satisfactory results, despite comments in the literature to the contrary. The analysis can now be carried out with single peaks; multiple orders are not required.

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