120-GHz Active Wafer Probes for Picosecond Device Measurement

Authors:

1 January 1989

conference paper
Published by Optica Publishing Group

p. HSMT31
DOI:10.1364/peo.1989.hsmt31

Abstract

We have developed frequency-multiplier and harmonic mixer active wafer probes for picosecond device measurements to 120 GHz. All-electronic 100 GHz on-wafer frequency-response measurements have been demonstrated using these probes.

Keywords

FREQUENCY MEASUREMENT
GALLIUM ARSENIDE
HARMONIC GENERATION
SIGNAL PROCESSING
ULTRAFAST DEVICES
ULTRAFAST MEASUREMENT

This publication has 2 references indexed in Scilit:

Millimetre-wave active probe frequency-multiplier for on-wafer characterisation of GaAs devices and ICs
Electronics Letters, 1989
Picosecond Electrical Pulse for VLSI Electronics Characterization
1987