Experimental and theoretical investigation of needle contact behavior of wafer level probing
Authors:
- Hao-Yuan ChangHCHao-Yuan Chang
- Wen-Fung PanWPWen-Fung Pan
- Shueei-Muh LinSLShueei-Muh Lin
- 1 April 2011
- journal article
- Published by Elsevier in Precision Engineering
- Vol. 35 (2) , 294-301