Angle-resolved photoemission spectroscopy of ultrathin films of H2-phthalocyanine on MoS2 surfaces

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Abstract
The angle‐resolved ultraviolet photoelectron spectra were measured for ultrathin films of H2–phthalocyanine deposited on cleaved MoS2 surfaces using synchrotron radiation. The take‐off angle (θ) dependence of photoelectron intensity from the highest π band showed a sharp maximum at θ=34°. The observed angular distribution could be explained excellently by an angular distribution calculated for flat‐lie orientation of the molecules using independent‐atomic‐center approximation combined with molecular orbital calculation. The results confirm that the calculation method is useful to describe photoelectron angular distribution from thin films of large and complex organic molecules and H2‐phthalocyanine molecules lie flatly on MoS2 surface.

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