New difference reflectance methods for study of small interfacial effects

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Abstract
Two sensitive differential optical techniques useful for study of small reflectance or absorptive differences between two interfaces are described. The first scheme employs a mechanically chopped light beam impinging on an arrangement of symmetrical dual cells to allow detection of differential reflectances DeltaR/R<10(-3). The second is a polarization-modulated beam-split laser version of the same method yielding approximately the same sensitivity. Representative measurements of voltage-induced reflectance changes at liquid-solid interfaces using these methods are given.

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