Dependence of the mobility and trap concentration in evaporated copper phthalocyanine thin films on background pressure and evaporation rate
Author:
- 14 September 1986
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 19 (9) , 1785-1790
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- D.C. electrical measurements on evaporated thin films of copper phthalocyanineThin Solid Films, 1985
- Electrical conduction and trapping distributions in ZnO and ZnO-Sn composite varistorsJournal of Physics D: Applied Physics, 1983
- Transient currents in copper phthalocyanine layersThin Solid Films, 1982
- The interpretation of space-charge-limited currents in semiconductors and insulatorsJournal of Applied Physics, 1982
- Power-law currents in some ZnO-Sn composite materialsJournal of Physics D: Applied Physics, 1981
- On the trap distribution in thin films of copper phthalocyaninePhysica Status Solidi (b), 1968
- Electrical Properties of Copper Phthalocyanine Thin Films as Influenced by the AmbientJournal of Applied Physics, 1967
- Space-Charge-Limited Currents in Copper Phthalocyanine Thin FilmsJournal of Applied Physics, 1967
- Electron injection in thin films of copper phtalocyanineSolid State Communications, 1964
- Volume-controlled current injection in insulatorsReports on Progress in Physics, 1964