Accurate X-ray absorption spectra obtained from concentrated bulk samples by fluorescence detection
Authors:
- D.M. PeaseDPD.M. Pease
- D.L. BreweDBD.L. Brewe
- Z. TanZTZ. Tan
- J.I. BudnickJBJ.I. Budnick
- C.C. LawCLC.C. Law
- 1 June 1989
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 138 (4-5) , 230-234
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Surface extended x-ray-absorption fine-structure spectroscopy measurement using the evanescent-wave effect of fluorescent x raysPhysical Review B, 1989
- Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structurePhysical Review B, 1988
- Surface-film and interfacial analysis via variable grazing exit angle x-ray fluorescence spectrometryApplied Surface Science, 1988
- Electron yield X-ray absorption spectroscopy at atmospheric pressurePhysics Letters A, 1987
- Chemical Analysis of Surfaces by Total-Reflection-Angle X-Ray Spectroscopy in RHEED Experiments (RHEED-TRAXS)Japanese Journal of Applied Physics, 1985
- Electron-yield extended x-ray absorption fine structure with the use of a gas-flow electron detectorPhysical Review B, 1984
- Many-body effects on extended x-ray absorption fine structure amplitudesPhysical Review B, 1980
- Fluorescence detection of exafs: Sensitivity enhancement for dilute species and thin filmsSolid State Communications, 1977