Large-scale calibration method for MEMS-based projector 3D reconstruction

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Abstract
Projectors based on Micro-Electro-Mechanical System (MEMS) have the advantages of small size and low cost. Moreover, uniaxial MEMS projectors have high projection accuracy, and have been widely used in structured light 3D reconstruction. However, the existing calibration methods for uniaxial MEMS projectors are not effective in large-scale scenes. To solve this problem, this paper proposes a novel efficient large-scale calibration method, which is easily implemented. The proposed method first calibrates a partial light plane for a fixed sampling period, then obtains the rest of the light plane by exploiting a non-fixed rotating shaft linear interpolation method. Experimental results verify that the proposed method attains high accuracy in a large depth field with only 11 sets of calibration data. Specifically, at a distance of 3000mm, the standard deviation of the plane fitting error reaches 0.2584mm on the standard plane, and the measurement accuracy attains 0.9124mm on the standard step object with 200mm interval.
Funding Information
  • Innovation Workstation of Suzhou Institute of Nano-Tech and Nano-Bionics (E010210101)
  • Suzhou Institute of Nanotechnology, Chinese Academy of Sciences (E290010201)
  • Chinese Academy of Sciences Project (E21Z010101)

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