Photoelectric Yields for Oblique Incidence of Extreme Ultraviolet Radiation*

Authors:
  • LHL. Heroux
    L. Heroux
  • JMJ. E. Manson
    J. E. Manson
  • HHH. E. Hinteregger
    H. E. Hinteregger
  • WMW. J. McMahon
    W. J. McMahon
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Abstract
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