Resistivity of RMn12−xFex alloys
- 1 December 2001
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 90 (11) , 5632-5636
Abstract
The electrical resistivity of RMn12−xFex (R=Er,Ho) polycrystalline system with x=0, 4, 5, and 6 was measured over the temperature range of 4 to 300 K. The resistivity increases sharply near the Néel temperature TN for x=4, 5, and 6 which, according to existing theories, can be ascribed to the formation of superzone gaps. Then, the resistivity increase should be proportional to the staggered magnetization m′ below TN, whereas we find experimentally that it is quadratic in m′. Thermal smearing of the gaps can lead to such a dependence. There is no evidence for superzone effects in x=0 compounds. A combination of spin disorder, phonon, and impurity scattering gives a good account for the experimental data.Keywords
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