Fast mechanical model for probe–sample elastic deformation estimation in scanning probe microscopy
Open Access
- 1 June 2019
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 201, 18-27
Abstract
No abstract availableKeywords
Funding Information
- Grant Agency (GA1517875S)
This publication has 18 references indexed in Scilit:
- Quantitative mapping of elastic moduli at the nanoscale in phase separated polyurethanes by AFMEuropean Polymer Journal, 2011
- Comparative analysis on the nanoindentation of polymers using atomic force microscopyPolymer Testing, 2010
- Atomic force microscopy probing of cell elasticityMicron, 2007
- Force measurements with the atomic force microscope: Technique, interpretation and applicationsSurface Science Reports, 2005
- An Average-Stretch Full-Network Model for Rubber ElasticityJournal of Elasticity, 2003
- Study of Elastic Modulus and Yield Strength of Polymer Thin Films Using Atomic Force MicroscopyLangmuir, 2001
- Constitutive Models of Rubber Elasticity: A ReviewRubber Chemistry and Technology, 2000
- Discrete and continuous deformation during nanoindentation of thin filmsActa Materialia, 2000
- The effect of deformation on the lateral resolution of atomic force microscopyJournal of Microscopy, 1996
- Young's Modulus, Shear Modulus, and Poisson's Ratio in Silicon and GermaniumJournal of Applied Physics, 1965