Temperature-dependent x-ray fluorescent response from thermographic phosphors under x-ray excitation
- 19 July 2021
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 119 (3) , 034103
Abstract
Phosphor thermometry has been successfully applied within several challenging environments. Typically, the thermographic phosphors are excited by an ultraviolet light source, and the temperature-dependent spectral or temporal response is measured. However, this is challenging or impossible in optically thick environments. In addition, emission from other sources (e.g., a flame) may interfere with the optical phosphor emission. A temperature dependent x-ray excitation/emission could alleviate these issues as x-rays could penetrate obscurants with no interference from flame luminosity. In addition, x-ray emission could allow for thermometry within solids while simultaneously x-ray imaging the structural evolution. In this study, select thermographic phosphors were excited via x-ray radiation, and their x-ray emission characteristics were measured at various temperatures. Several of the phosphors showed varying levels of temperature dependence with the strongest sensitivity occurring for YAG:Dy and ZnGa2O4:Mn. This approach opens a path for less intrusive temperature measurements, particularly in optically opaque multiphase and solid phase combustion environments.Keywords
Funding Information
- Office of Naval Research (N00014-16-1-2557)
- Air Force Office of Scientific Research (FA9550-15-1-0102)
- National Aeronautics and Space Administration (80NSSC17K0190)
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