Rankings
Publications
Search Publications
Cited-by Search
Sources
Publishers
Scholars
Scholars
Top Cited Scholars
Organizations
About
Scilit
About Us
Advisory Board
Data Sources
Career
Support / Contact
User Guide
Publisher User
Search Function
Rankings Function
API Resource
Scilit Knowledge
Metrics
Scilit Recognitions
Publications Classification
Media
News
Blog
Login
Register
Home
Publications
EPR Study of Proton Implantation Induced Intrinsic Defects in 6H- and 4H-SiC
Home
Publications
EPR Study of Proton Implantation Induced Intrinsic Defects in 6H- and 4H-SiC
EPR Study of Proton Implantation Induced Intrinsic Defects in 6H- and 4H-SiC
Authors:
HB
Hans Jürgen von Bardeleben
Hans Jürgen von Bardeleben
JC
J.L. Cantin
J.L. Cantin
Article Alert
Citation Alert
Add to Library
Cite
Download
Share
Download
Download PDF
Download
Publisher website
Google Scholar
17 January 2001
journal article
Published by
Trans Tech Publications, Ltd.
in
Materials Science Forum
Vol. 353-356
,
513-516
DOI:
10.4028/www.scientific.net/msf.353-356.513
Abstract
No abstract available
Keywords
DEFECT
ELECTRON PARAMAGNETIC RESONANCE (EPR)
IMPLANTATION DAMAGE
VACANCY DEFECTS
Cited
Cited by 9 articles
Scroll to top