Crystallographic orientation effects in energy dispersive X-ray analysis
Authors:
- 1 December 1981
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 44 (6) , 1335-1350
Abstract
The circumstances under which EDX microanalysis can yield serious errors as a function of the crystallographic orientation are discussed. It is shown that such errors can be as high as 50° when examining a fully ordered alloy or compound. Experimental results obtained on CuPt are correlated with a theoretical treatment demonstrating both the necessity in such calculations of considering Bloch wave summation effects and that the small value of the impact parameter thus inferred is consistent with a simple time-dependent perturbation treatment of the inelastic scattering process. The reasons why localization effects should be less apparent in energy loss than in EDX measurements are also considered.Keywords
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