Measurement of the modal reflectivity of an antireflection coating on a superluminescent diode
Authors:
- G. EisensteinGEG. Eisenstein
- L. StulzLSL. Stulz
- 1 April 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 19 (4) , 493-495
Abstract
A method for measuring the modal reflectivity of the antireflection coating applied to a laser diode is described and demonstrated. It is based on measurements of the Fabry-Perot modulation depth of the resulting superluminescent diode (SLD) output spectrum at the threshold current of the original laser. A modal reflectivity of less than2 \times 10^{-4}has been obtained.Keywords
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