General analysis of noise in recorded transitions in thin film recording media
Authors:
- H.N. BertramHBH.N. Bertram
- X. CheXCX. Che
- 1 January 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 29 (1) , 201-208
Abstract
No abstract availableThis publication has 26 references indexed in Scilit:
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